Experimental and theoretical thermal analysis of microelectronic devices

Author(s)
Heng, Stephen Fook-Geow
Advisor(s)
Black, William Z.
Editor(s)
Associated Organization(s)
Supplementary to:
Abstract
Sponsor
Date
1988-08
Extent
Resource Type
Text
Resource Subtype
Dissertation
Rights Statement
Access restricted to authorized Georgia Tech users only.
Rights URI