Title:
Imaging System And Method For Multi-scale Three-dimensional Deformation Or Profile Output

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dc.contributor.patentcreator Xia, Shuman
dc.contributor.patentcreator Zhang, Jingwen
dc.date.accessioned 2018-04-24T16:56:59Z
dc.date.available 2018-04-24T16:56:59Z
dc.date.filed 2013-07-31
dc.date.issued 2017-11-21
dc.description.abstract An optical microscope system for 3D surface deformation and morphology measurement that can serve as a powerful tool in quality engineering and control, as well as in biological and materials research is described. The system was developed in part by combining the DAIC technique with optical microscopy. Decoding algorithms were derived for calculating the 3D displacement or profile of a micro-sized test sample from the in-plane displacement components of it first-order diffracted views.
dc.description.assignee Georgia Tech Research Corporation
dc.identifier.cpc G02B21/361
dc.identifier.cpc G01B9/04
dc.identifier.cpc G01B11/16
dc.identifier.patentapplicationnumber 13/955792
dc.identifier.patentnumber 9823458
dc.identifier.uri http://hdl.handle.net/1853/59624
dc.title Imaging System And Method For Multi-scale Three-dimensional Deformation Or Profile Output
dc.type Text
dc.type.genre Patent
dspace.entity.type Publication
local.contributor.corporatename Georgia Institute of Technology
local.relation.ispartofseries Georgia Tech Patents
relation.isOrgUnitOfPublication cc30e153-7a64-4ae2-9b1d-5436686785e3
relation.isSeriesOfPublication 0f49c79d-4efb-4bd9-b060-5c7f9191b9da
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