Title:
Imaging System And Method For Multi-scale Three-dimensional Deformation Or Profile Output
Imaging System And Method For Multi-scale Three-dimensional Deformation Or Profile Output
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Abstract
An optical microscope system for 3D surface deformation and morphology measurement that can serve as a powerful tool in quality engineering and control, as well as in biological and materials research is described. The system was developed in part by combining the DAIC technique with optical microscopy. Decoding algorithms were derived for calculating the 3D displacement or profile of a micro-sized test sample from the in-plane displacement components of it first-order diffracted views.
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2017-11-21
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Patent