Title:
Bayesian Surprise and Landmark Detection

dc.contributor.author Ranganathan, Ananth
dc.contributor.author Dellaert, Frank
dc.contributor.corporatename Georgia Institute of Technology. Center for Robotics and Intelligent Machines
dc.contributor.corporatename Georgia Institute of Technology. College of Computing
dc.contributor.corporatename Honda Research Institute USA, Inc.
dc.date.accessioned 2011-04-01T19:50:56Z
dc.date.available 2011-04-01T19:50:56Z
dc.date.issued 2009-05
dc.description ©2009 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other users, including reprinting/ republishing this material for advertising or promotional purposes, creating new collective works for resale or redistribution to servers or lists, or reuse of any copyrighted components of this work in other works. en_US
dc.description Presented at the 2009 IEEE International Conference on Robotics and Automation (ICRA), 12-17 May 2009, Kobe, Japan.
dc.description DOI: 10.1109/ROBOT.2009.5152376
dc.description.abstract Automatic detection of landmarks, usually special places in the environment such as gateways, for topological mapping has proven to be a difficult task. We present the use of Bayesian surprise, introduced in computer vision, for landmark detection. Further, we provide a novel hierarchical, graphical model for the appearance of a place and use this model to perform surprise-based landmark detection. Our scheme is agnostic to the sensor type, and we demonstrate this by implementing a simple laser model for computing surprise. We evaluate our landmark detector using appearance and laser measurements in the context of a topological mapping algorithm, thus demonstrating the practical applicability of the detector. en_US
dc.identifier.citation Ranganathan, A., & Dellaert, F. (2009). “Bayesian Surprise and Landmark Detection". Proceedings of the IEEE International Conference on Robotics and Automation (ICRA 2009), 12-17 May 2009, 2017-2023. en_US
dc.identifier.issn 1050-4729
dc.identifier.uri http://hdl.handle.net/1853/38367
dc.language.iso en_US en_US
dc.publisher Georgia Institute of Technology en_US
dc.publisher.original Institute of Electrical and Electronics Engineers
dc.subject Bayesian surprise en_US
dc.subject Computer vision en_US
dc.subject Landmark detection en_US
dc.subject Topological mapping en_US
dc.title Bayesian Surprise and Landmark Detection en_US
dc.type Text
dc.type.genre Post-print
dc.type.genre Proceedings
dspace.entity.type Publication
local.contributor.author Dellaert, Frank
local.contributor.corporatename Institute for Robotics and Intelligent Machines (IRIM)
local.contributor.corporatename College of Computing
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relation.isOrgUnitOfPublication c8892b3c-8db6-4b7b-a33a-1b67f7db2021
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