Title:
X-ray diffraction/EDXA/SEM
X-ray diffraction/EDXA/SEM
| dc.contributor.author | Parham, Russell A. | en_US |
| dc.contributor.author | Hultman, Jack D. | en_US |
| dc.contributor.corporatename | Institute of Paper Chemistry (Appleton, Wis.) | en_US |
| dc.date.accessioned | 2004-09-10T14:42:42Z | |
| dc.date.available | 2004-09-10T14:42:42Z | |
| dc.date.issued | 1975-08 | en_US |
| dc.description | "August, 1975." | en_US |
| dc.format.extent | 1115941 bytes | |
| dc.format.mimetype | application/pdf | |
| dc.identifier.uri | http://hdl.handle.net/1853/2942 | |
| dc.language.iso | en_US | en_US |
| dc.publisher | Appleton, Wisconsin : the Institute, | en_US |
| dc.publisher | Georgia Institute of Technology | en_US |
| dc.relation.ispartofseries | IPC technical paper series ; no.13 | en_US |
| dc.subject.other | X rays | en_US |
| dc.subject.other | Diffraction | en_US |
| dc.subject.other | Scanning electron microscopy | en_US |
| dc.title | X-ray diffraction/EDXA/SEM | en_US |
| dc.type | Text | |
| dc.type.genre | Technical Paper | |
| dspace.entity.type | Publication | |
| local.contributor.corporatename | Institute of Paper Science and Technology | |
| relation.isOrgUnitOfPublication | 6c27e726-78e5-4645-8d27-6b6724df05af |
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