Title:
Force microscopy of two-dimensional materials
Force microscopy of two-dimensional materials
| dc.contributor.advisor | Riedo, Elisa | |
| dc.contributor.author | Gao, Yang | |
| dc.contributor.committeeMember | First, Phillip | |
| dc.contributor.committeeMember | Davidovic, Dragomir | |
| dc.contributor.committeeMember | Jiang, Zhigang | |
| dc.contributor.committeeMember | Degertekin, Levent | |
| dc.contributor.department | Physics | |
| dc.date.accessioned | 2018-05-31T18:09:26Z | |
| dc.date.available | 2018-05-31T18:09:26Z | |
| dc.date.created | 2017-05 | |
| dc.date.issued | 2017-04-07 | |
| dc.date.submitted | May 2017 | |
| dc.date.updated | 2018-05-31T18:09:26Z | |
| dc.description.abstract | Atomic Force Microscopy (AFM) is a powerful tool for the characterization and fabrication of two-dimensional materials, which are films of a few atomic layers with strong in-plane bonds and weak van der Waals interactions between the layers. The in-plane elasticity has been widely studied with nano-indentation where a suspended 2D film is bent substantially (~10nm to 1000nm). In this thesis we report on a novel AFM-based sub-Å-resolution indentation technique: Modulated nano-indentation (MoNI) or "Å-indentation". MoNI can allow for indentation below 1 Å, smaller than the inter-layer distance of most 2D materials. The perpendicular-to-the-plane elasticity of 2D materials can be detected with MoNI at extremely high precision while the in-plane covalent bonds are negligible. The inter-layer elasticity as well as intercalation properties of epitaxial graphene, graphene oxide and other 2D materials were carefully investigated. Furthermore, the fingerprint of a new ultra-hard phase of epitaxial graphene on SiC(0001), indicating possible diamondization at room temperature, has been observed and reported in this thesis. | |
| dc.description.degree | Ph.D. | |
| dc.format.mimetype | application/pdf | |
| dc.identifier.uri | http://hdl.handle.net/1853/59799 | |
| dc.language.iso | en_US | |
| dc.publisher | Georgia Institute of Technology | |
| dc.subject | AFM | |
| dc.subject | Two-dimensional materials | |
| dc.subject | van der Waals force | |
| dc.subject | Elasticity | |
| dc.title | Force microscopy of two-dimensional materials | |
| dc.type | Text | |
| dc.type.genre | Dissertation | |
| dspace.entity.type | Publication | |
| local.contributor.corporatename | College of Sciences | |
| local.contributor.corporatename | School of Physics | |
| relation.isOrgUnitOfPublication | 85042be6-2d68-4e07-b384-e1f908fae48a | |
| relation.isOrgUnitOfPublication | 2ba39017-11f1-40f4-9bc5-66f17b8f1539 | |
| thesis.degree.level | Doctoral |