Title:
Modeling hot-electron injection and impact ionization in pFET's
Modeling hot-electron injection and impact ionization in pFET's
dc.contributor.advisor | Brennan, Kevin F. | |
dc.contributor.author | Duffy, Christopher James | en_US |
dc.contributor.department | Electrical and computer engineering | en_US |
dc.date.accessioned | 2007-06-21T13:02:56Z | |
dc.date.available | 2007-06-21T13:02:56Z | |
dc.date.issued | 2001-12 | en_US |
dc.description.degree | M.S. | en_US |
dc.identifier.bibid | 622188 | en_US |
dc.identifier.uri | http://hdl.handle.net/1853/14796 | |
dc.publisher | Georgia Institute of Technology | en_US |
dc.rights | Access restricted to authorized Georgia Tech users only. | en_US |
dc.subject.lcsh | Electron impact ionization | en_US |
dc.subject.lcsh | Metal oxide semiconductors | en_US |
dc.subject.lcsh | Metal oxide semiconductor field-effect transistors | en_US |
dc.title | Modeling hot-electron injection and impact ionization in pFET's | en_US |
dc.type | Text | |
dc.type.genre | Thesis | |
dspace.entity.type | Publication | |
local.contributor.corporatename | School of Electrical and Computer Engineering | |
local.contributor.corporatename | College of Engineering | |
relation.isOrgUnitOfPublication | 5b7adef2-447c-4270-b9fc-846bd76f80f2 | |
relation.isOrgUnitOfPublication | 7c022d60-21d5-497c-b552-95e489a06569 |
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