Title:
Modeling hot-electron injection and impact ionization in pFET's

dc.contributor.advisor Brennan, Kevin F.
dc.contributor.author Duffy, Christopher James en_US
dc.contributor.department Electrical and computer engineering en_US
dc.date.accessioned 2007-06-21T13:02:56Z
dc.date.available 2007-06-21T13:02:56Z
dc.date.issued 2001-12 en_US
dc.description.degree M.S. en_US
dc.identifier.bibid 622188 en_US
dc.identifier.uri http://hdl.handle.net/1853/14796
dc.publisher Georgia Institute of Technology en_US
dc.rights Access restricted to authorized Georgia Tech users only. en_US
dc.subject.lcsh Electron impact ionization en_US
dc.subject.lcsh Metal oxide semiconductors en_US
dc.subject.lcsh Metal oxide semiconductor field-effect transistors en_US
dc.title Modeling hot-electron injection and impact ionization in pFET's en_US
dc.type Text
dc.type.genre Thesis
dspace.entity.type Publication
local.contributor.corporatename School of Electrical and Computer Engineering
local.contributor.corporatename College of Engineering
relation.isOrgUnitOfPublication 5b7adef2-447c-4270-b9fc-846bd76f80f2
relation.isOrgUnitOfPublication 7c022d60-21d5-497c-b552-95e489a06569
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