Title:
A Discussion of Practical Applications

dc.contributor.author Cruickshank, John
dc.contributor.corporatename Georgia Institute of Technology. Institute for Electronics and Nanotechnology en_US
dc.contributor.corporatename Nanotronics Imaging en_US
dc.date.accessioned 2017-07-28T15:38:52Z
dc.date.available 2017-07-28T15:38:52Z
dc.date.issued 2017-06-28
dc.description Presented on June 28, 2017 at 12:15 p.m. in the Marcus Nanotechnology Building, Room 1116. en_US
dc.description Presented as part of the IEN Industry Seminar Series, "The Future of Advanced Manufacturing". en_US
dc.description John Cruickshank is the Solution Architect at Nanotronics Imaging. en_US
dc.description Runtime: 30:43 minutes en_US
dc.description Videos removed from record at the request of the author on 4/9/18.
dc.description.abstract Combining optical microscopy, computational super-resolution, artificial intelligence, and robotics, Nanotronics is bringing the world’s most advanced microscope to every manufacturing sector. We automate industrial microscopes used for inspection of the world's most advanced technologies: semiconductors, microchips, hard drives, LEDs, aerospace hardware, nano-fillers, nanotubes, nano-medicine, and more. Our microscopes are an integrated part of production processes at many of the world's leading manufacturers. Our software is the first industrial application for cognitive artificial intelligence that seamlessly integrates across factories and each stage of production. Nanotronics software detects and classifies nanoscale features with minimal user training. This seminar will focus on the future of advanced manufacturing and how Nanotronics is bringing tools and software to market to help achieve that vision. Central to that vision is the concept of Artificial Intelligence Process Control – a concept that will be enabled through innovation taking place in our labs and from feedback at customer sites that are beginning to transform their production lines with our technology. We plan to address advancements in image analysis software, automation, and a variety of specific use-cases we’ve encountered over the course of the past several years. en_US
dc.format.extent 30:43 minutes
dc.identifier.uri http://hdl.handle.net/1853/58440
dc.language.iso en_US en_US
dc.relation.ispartofseries IEN Industry Seminar Series en_US
dc.subject Cognitive artificial intelligence en_US
dc.subject Microscope en_US
dc.subject Nanoscale en_US
dc.title A Discussion of Practical Applications en_US
dc.type Moving Image
dc.type.genre Presentation
dspace.entity.type Publication
local.contributor.corporatename Institute for Electronics and Nanotechnology (IEN)
local.relation.ispartofseries IEN Industry Seminar Series
relation.isOrgUnitOfPublication 5d316582-08fe-42e1-82e3-9f3b79dd6dae
relation.isSeriesOfPublication ea1f67bf-5efb-42a7-b27c-45185d006477
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