Title:
Temperature robust programmable subthreshold circuits through a balanced force approach

dc.contributor.advisor Hasler, Jennifer
dc.contributor.author Degnan, Brian Paul en_US
dc.contributor.committeeMember Bradley Minch
dc.contributor.committeeMember Anderson, David
dc.contributor.committeeMember Maysam Ghovanloo
dc.contributor.committeeMember Saibal Mukhopadhyay
dc.contributor.department Electrical and Computer Engineering en_US
dc.date.accessioned 2013-06-15T02:38:01Z
dc.date.available 2013-06-15T02:38:01Z
dc.date.issued 2013-01-18 en_US
dc.description.abstract The subthreshold region of operation has simple physics which allows for a balanced-force approach to behavioral modeling that has shown to be robust to temperature, and a model that encapsulates MOSFET behavior across all operational regions has been developed. The subthreshold region of operation also allows for injection of charge onto floating nodes that allows for persistent storage that can be used in a variety of applications. The combination of charge storage and device modeling has allowed for the development of programmable circuits for digital applications. en_US
dc.description.degree PhD en_US
dc.identifier.uri http://hdl.handle.net/1853/47548
dc.publisher Georgia Institute of Technology en_US
dc.subject Floating-gate transistors en_US
dc.subject Compact EKV en_US
dc.subject Subthreshold en_US
dc.subject.lcsh Transistors
dc.subject.lcsh Integrated circuits
dc.subject.lcsh Microelectronics
dc.title Temperature robust programmable subthreshold circuits through a balanced force approach en_US
dc.type Text
dc.type.genre Dissertation
dspace.entity.type Publication
local.contributor.advisor Hasler, Jennifer
local.contributor.corporatename School of Electrical and Computer Engineering
local.contributor.corporatename College of Engineering
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relation.isOrgUnitOfPublication 7c022d60-21d5-497c-b552-95e489a06569
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