Title:
Characterization of nanometer-scale defects in metallic glasses by quantitative high-resolution transmission electron microscopy
Characterization of nanometer-scale defects in metallic glasses by quantitative high-resolution transmission electron microscopy
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Author(s)
Li, Jing
Wang, Z. L. (Zhong Lin)
Hufnagel, T. C.
Wang, Z. L. (Zhong Lin)
Hufnagel, T. C.
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Abstract
Although defects can have a significant effect on the properties of amorphous materials, in many cases these
defects are poorly characterized and understood. This is at least partly due to the difficulty of imaging defects
in amorphous materials in the electron microscope. In this work, we demonstrate the utility of quantitative
analysis of high-resolution transmission electron microscopy for the identification and characterization of
nanometer-scale defects in metallic glasses. For a proper identification of such defects, it is important to
carefully consider the effects of the imaging conditions and thickness variations in the sample, both of which
we describe in detail. As an example, we show that regions of localized plastic deformation (shear bands) in
bulk metallic glasses contain a high concentration of nanometer-scale voids. These voids apparently result from
the coalescence of excess free volume once the applied stress is removed.
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Date Issued
2002-03-25
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Article