Title:
Methods for extending high-performance automated test equipment (ATE) using multi-gigahertz FPGA technologies
Methods for extending high-performance automated test equipment (ATE) using multi-gigahertz FPGA technologies
Author(s)
Majid, Ashraf Muhammad
Advisor(s)
Keezer, David C.
Editor(s)
Collections
Supplementary to
Permanent Link
Abstract
Methods for Extending High-Performance Automated Test Equipment (ATE) using
Multi-Gigahertz FPGA Technologies
Ashraf M. Majid
264 Pages
Directed by Dr. David Keezer
This thesis presents methods for developing multi-function, multi-GHz, FPGAbased
test modules designed to enhance the performance capabilities of automated test
equipment (ATE). The methods are used to develop a design approach that utilizes a test
module structure in two blocks. A core logic block is designed using a multi-GHz FPGA
that provides control functions. Another block called the â application specificâ logic
block includes components required for specific test functions. Six test functions are
demonstrated in this research: high-speed signal multiplexing, loopback testing, jitter
injection, amplitude adjustment, and timing adjustment. Furthermore, the test module is
designed to be compatible with existing ATE infrastructure, thus retaining full ATE
capabilities for standard tests. Experimental results produced by this research provide
evidence that the methods are sufficiently capable of enhancing the multi-GHz testing
capabilities of ATE and are extendable into future ATE development. The modular
approach employed by the methods in this thesis allow for flexibility and future
upgradability to even higher frequencies. Therefore the contributions made in this thesis
have the potential to be used into the foreseeable future for enhancements to
semiconductor test capabilities.
Sponsor
Date Issued
2011-03-31
Extent
Resource Type
Text
Resource Subtype
Dissertation