Title:
Using surface plasmon resonance spectroscopy to characterize thin composite films
Using surface plasmon resonance spectroscopy to characterize thin composite films
Authors
Shinall, Brian Darnell
Authors
Advisors
White, Mark G.
Advisors
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Abstract
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Date Issued
2000-12
Extent
239 bytes
Resource Type
Text
Resource Subtype
Thesis
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Access restricted to authorized Georgia Tech users only.