Title:
Performing Retardation Measurements

dc.contributor.patentcreator Montarou, Carole C.
dc.contributor.patentcreator Gaylord, Thomas K.
dc.date.accessioned 2017-05-12T14:28:23Z
dc.date.available 2017-05-12T14:28:23Z
dc.date.filed 9/24/2004
dc.date.issued 6/19/2007
dc.description.abstract Systems and methods of measuring birefringence or retardation are provided. For some embodiments, a system is provided, which comprises a polarizer, an analyzer, a first waveplate, and a second waveplate. The system is configured to obtain light intensity measurements by recursively rotating the second waveplate. The obtained light intensity measurements are retrieved, and a light transmission intensity curve is determined from the light intensity measurements.
dc.description.assignee Georgia Tech Research Corporation
dc.identifier.cpc G01N21/23
dc.identifier.cpc G01J4/00
dc.identifier.patentapplicationnumber 10/950048
dc.identifier.patentnumber 7233395
dc.identifier.uri http://hdl.handle.net/1853/57692
dc.identifier.uspc 356/365
dc.title Performing Retardation Measurements
dc.type Text
dc.type.genre Patent
dspace.entity.type Publication
local.contributor.corporatename Georgia Institute of Technology
local.relation.ispartofseries Georgia Tech Patents
relation.isOrgUnitOfPublication cc30e153-7a64-4ae2-9b1d-5436686785e3
relation.isSeriesOfPublication 0f49c79d-4efb-4bd9-b060-5c7f9191b9da
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