Title:
Technology assessment of active devices (TAAD) for radar and ECM applications

dc.contributor.author Heckman, Jerry Joseph en_US
dc.contributor.corporatename Georgia Institute of Technology. Office of Sponsored Programs en_US
dc.contributor.corporatename Georgia Institute of Technology. Engineering Experiment Station en_US
dc.contributor.corporatename Georgia Institute of Technology. Office of Sponsored Programs
dc.date.accessioned 2012-11-15T12:32:23Z
dc.date.available 2012-11-15T12:32:23Z
dc.date.issued 1973 en_US
dc.description Issued as Quarterly report 1-8, and Technical report 1-2, Project no. A-1497 en_US
dc.identifier.other 80344 en_US
dc.identifier.uri http://hdl.handle.net/1853/45406
dc.publisher Georgia Institute of Technology en_US
dc.relation.ispartofseries Engineering Experiment Station ; Project no. A-1497 en_US
dc.subject.lcsh Integrated circuits Reliability en_US
dc.subject.lcsh Radar en_US
dc.title Technology assessment of active devices (TAAD) for radar and ECM applications en_US
dc.type Text
dc.type.genre Technical Report
dspace.entity.type Publication
local.contributor.corporatename Georgia Tech Research Institute (GTRI)
relation.isOrgUnitOfPublication 3928f3f0-0759-4b3a-aa0a-10075096fef4
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