Curtis, Jennifer E.

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    Manipulating Light: From Design to Application
    (Georgia Institute of Technology, 2013-02-19) Curtis, Jennifer E. ; Hales, Joel M. ; Fuentes Hernández, Canek
    As the thirst for digital information continues to grow, the development of technologies that allow for larger amounts of information to be conveyed at ever faster rates is critical. While electronics has been the workhorse in this area of information technology for over 100 years, photonics—the use of photons (light) for these applications—has made significant inroads over the past 30 years, mainly because of their potential for increased speed and bandwidth. Join us to learn how Georgia Tech researchers are synthesizing the materials that enable photonic devices (a combination of organic and inorganic nanomaterials) and fabricating the devices themselves, and see where these new devices are being applied.
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    Aberration correction in wide-field fluorescence microscopy by segmented-pupil image interferometry
    (Georgia Institute of Technology, 2012-06) Scrimgeour, Jan ; Curtis, Jennifer E.
    We present a new technique for the correction of optical aberrations in wide-field fluorescence microscopy. Segmented-Pupil Image Interferometry (SPII) uses a liquid crystal spatial light modulator placed in the microscope’s pupil plane to split the wavefront originating from a fluorescent object into an array of individual beams. Distortion of the wavefront arising from either system or sample aberrations results in displacement of the images formed from the individual pupil segments. Analysis of image registration allows for the local tilt in the wavefront at each segment to be corrected with respect to a central reference. A second correction step optimizes the image intensity by adjusting the relative phase of each pupil segment through image interferometry. This ensures that constructive interference between all segments is achieved at the image plane. Improvements in image quality are observed when Segmented-Pupil Image Interferometry is applied to correct aberrations arising from the microscope’s optical path.