Person:
Mukhopadhyay, Saibal

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System Impact of 3D Processor-Memory Interconnect: A Limit Study

2011 , Rasquinha, Mitchelle , Hassan, Syed Minhaj , Song, William , Chae, Kwanyeob , Cho, Minki , Mukhopadhyay, Saibal , Yalamanchili, Sudhakar

3D integration with through-silicon-vias (TSVs) can provide enormous bandwidth between processor die and memory die. The central goal of our work is to explore the limits of performance improvement that can be achieved with such integration. Towards this end we propose a model of the impact of 3D TSVs on system performance. The model leads to several key observations i) increased miss tolerance (smaller caches) and hence improved core scaling for a fixed die size, ii) higher sustained IPC per core, iii) significantly smaller, energy efficient DRAM banks, iv) redistribution of system power to the cores and on -die interconnect, and v) TSV utilization is a function of the relationship between reference locality and the bandwidth properties of the intradie network. These observations are repeated in cycle level simulations of a 64 tile architecture.

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Thermal Field Management for Many-core Processors

2009-04-10 , Cho, Minki , Sathe, Nikhil , Yalamanchili, Sudhakar , Mukhopadhyay, Saibal

This paper first presents an analysis of the global thermal field in many core processors in deep nanometer (to 16nm) nodes under power and thermal budget. We show that the thermal field can have significant spatiotemporal non-uniformity along with high maximum temperature. We propose spatiotemporal power multiplexing as a proactive method to reduce spatial and temporal temperature gradients. Several power multiplexing policies are evaluated for a 256 core many-core processor in 16nm nodes which demonstrate that the simple cyclic core-activation can achieve highly uniform thermal field with low maximum temperature.