Mukhopadhyay, Saibal

Associated Organization(s)
ArchiveSpace Name Record

Publication Search Results

Now showing 1 - 1 of 1
  • Item
    System Impact of 3D Processor-Memory Interconnect: A Limit Study
    (Georgia Institute of Technology, 2011) Rasquinha, Mitchelle ; Hassan, Syed Minhaj ; Song, William ; Chae, Kwanyeob ; Cho, Minki ; Mukhopadhyay, Saibal ; Yalamanchili, Sudhakar
    3D integration with through-silicon-vias (TSVs) can provide enormous bandwidth between processor die and memory die. The central goal of our work is to explore the limits of performance improvement that can be achieved with such integration. Towards this end we propose a model of the impact of 3D TSVs on system performance. The model leads to several key observations i) increased miss tolerance (smaller caches) and hence improved core scaling for a fixed die size, ii) higher sustained IPC per core, iii) significantly smaller, energy efficient DRAM banks, iv) redistribution of system power to the cores and on -die interconnect, and v) TSV utilization is a function of the relationship between reference locality and the bandwidth properties of the intradie network. These observations are repeated in cycle level simulations of a 64 tile architecture.