Gaylord, Thomas K.
Permanent Link
Associated Organization(s)
ORCID
ArchiveSpace Name Record
58 results
Publication Search Results
Now showing 1 - 10 of 58
Item Concurrent three-dimensional characterization of the refractive-index and residual-stress distributions in optical fibers(Georgia Institute of Technology, 2012-08) Hutsel, Michael R.; Gaylord, Thomas K.Item Compact silicon diffractive sensor: design, fabrication, and prototype(Georgia Institute of Technology, 2012-07) Maikisch, Jonathan S.; Gaylord, Thomas K.Item Pattern-integrated interference lithography instrumentation(Georgia Institute of Technology, 2012-06) Burrow, Guy M.; Leibovici, Matthieu C. R.; Kummer, J. W.; Gaylord, Thomas K.Item Pattern-integrated interference lithography: single-exposure fabrication of photonic-crystal structures(Georgia Institute of Technology, 2012-06) Burrow, Guy M.; Leibovici, Matthieu C. R.; Gaylord, Thomas K.Item Multimode metal-insulator-metal waveguides: Analysis and experimental characterization(Georgia Institute of Technology, 2012-02) Lin, Chien-I; Gaylord, Thomas K.Item Three-beam interference lithography methodology(Georgia Institute of Technology, 2011-02) Stay, Justin L.; Burrow, Guy M.; Gaylord, Thomas K.Item Loss measurement of plasmonic modes in planar metal-insulator-metal waveguides by an attenuated total reflection method(Georgia Institute of Technology, 2010-11) Lin, Chien-I; Gaylord, Thomas K.Item Characterization of the loss of plasmonic modes in planar metal-insulator-metal waveguides by a coupling-simulation approach(Georgia Institute of Technology, 2010-02) Lin, Chien-I; Gaylord, Thomas K.Item Accurate cross-sectional stress profiling of optical fibers(Georgia Institute of Technology, 2009-09) Hutsel, Michael R.; Ingle, Reeve; Gaylord, Thomas K.Item Conditions for primitive-lattice-vector-direction equal contrasts in four-beam-interference lithography(Georgia Institute of Technology, 2009-08) Stay, Justin L.; Gaylord, Thomas K.